FIG. 1.
AFM measurement of CdSe and InGaP QDs. Representative AFM images of CdSe QD (A) and InGaP (C), with corresponding size distribution histogram (B) and (D), respectively. The average AFM-measured height of the CdSe QD was 6.9 ± 0.8 nm, and the average AFM-measured height of the InGaP QD was 4.2 ± 1.1 nm.