Skip to main content
. Author manuscript; available in PMC: 2008 Oct 8.
Published in final edited form as: J Mater Chem. 2008;18(17):1949–1960. doi: 10.1039/b714759g

Fig. 9.

Fig. 9

Secondary electron SEM images (shown as insets), elemental composition, and spectra for particles 1–4 shown in Fig. 8. The orientations of particles 1 and 2 ({100} facets in contact with the substrate) are different to those for particles 3 and 4 ({111} facets in contact with the substrate). Reprinted with permission from The Journal of Physical Chemistry C.46 Copyright 2007 American Chemical Society.

HHS Vulnerability Disclosure