Skip to main content
. 2009 Jan;133(1):93–109. doi: 10.1085/jgp.200810002

TABLE II.

Rate Constants Used for the Simulation Study

A Voltage (mV) kon (s−1) koff (s−1)
−60 33.5 14.8
−80 36 11.5
−100 40.5 8.9
−120 45.7 6.9
−140 50.7 5.4
−160 56.3 3.9
B [ATP] (μM) [ATP] · kbind (s−1) kunbind (s−1)
0.03 Kd 33 1,100
0.1 Kd 110 1,100
0.3 Kd 330 1,100
Kd 1,100 1,100
3 Kd 3,300 1,100
10 Kd 11,000 1,100
30 Kd 33,000 1,100
100 Kd 110,000 1,100
C [ATP] (μM) [ATP] · kbind (s−1) kunbind (s−1)
Kd 1,100 1,100
Kd 110 110
Kd 11 11
Kd 1.1 1.1
D [ATP] voltage (mV) [ATP] · kbind (s−1) kunbind (s−1) kon (s−1) koff (s−1)
Low −60 10 1,000 100 10
−160 100 1,000 100 10
High −60 100 1,000 100 10
−160 1,000 1,000 100 10

Rate constants were calculated based on the model in Fig. 10 A. (A) Calculated rate constants for the gating step, Kon and Koff, in Fig. 10 B. These values were used for the simulation study depicted in Fig. 11 (A–C). (B) [ATP] relative to the Kd and rate constants for the ATP-binding step used in Fig. 11 (A and C). (C) [ATP] relative to the Kd and rate constants for the ATP-binding step used in Fig. 11 B. (D) Rate constants used in Fig. 11 D. Here, it was assumed that kbind increases 10 times with the voltage change from −60 to −160 mV, whereas kon and koff are not voltage dependent.