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. 2008 Nov 26;105(49):19132–19135. doi: 10.1073/pnas.0810443105

Fig. 1.

Fig. 1.

Deformation map of spheroid as both parameter k and film stress are varied (with R/t = 20 and Ēfs = 30). In all buckled morphologies in Figs. 13 and Figs. S1 and S2, the dark (red) areas mean that within such concave regions, the magnitude of the radial displacement is smaller than a certain value; all snapshots of the morphology are rescaled to fit into the map. For ridged morphology, the number of buckles is shown on the top corner of each simulated pattern.