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. 2009 Mar;133(3):295–305. doi: 10.1085/jgp.200810125

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© 2009 Cheng et al.

This article is distributed under the terms of an Attribution–Noncommercial–Share Alike–No Mirror Sites license for the first six months after the publication date (see http://www.jgp.org/misc/terms.shtml). After six months it is available under a Creative Commons License (Attribution–Noncommercial–Share Alike 3.0 Unported license, as described at http://creativecommons.org/licenses/by-nc-sa/3.0/).

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Figure 8. — Single-channel recordings show significant gating heterogeneity. (A) Two continuous recordings of WT single channels at −100 mV showing low open probability (top) and high open probability (bottom) currents. (B) A continuous recording of WT single channels at the indicated voltages. (C) Plots of intraburst open probability for every channel burst in a patch of WT and I131C/I138D. The currents above show two bursts at −100 mV with contrasting open probabilities that correspond to the data points indicated by the arrows. Open probability and current amplitude are shown above each burst.