Skip to main content
. 2008 Sep 16;6(33):393–400. doi: 10.1098/rsif.2008.0236

Figure 5.

Figure 5

Correlations between circuit complexity and robustness (a) indicate that the system's integration rapidly increases with DZ, reaching a plateau. On the other hand, fault tolerance seems well correlated with complexity, as shown in (b) thus indicating that an appropriate internal integration allows the system to be more reliable under failure of single units.