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. 2000 Jan 4;97(1):23–27. doi: 10.1073/pnas.97.1.23

Table 1.

Deconvolution of C(1s) XPS peak components for polystyrene exposed to 25- and 50-eV CF3+ and C3F5+

Component Binding energy, eV 25-eV CF3+, % 25-eV C3F5+, % 50-eV CF3+, % 50-eV C3F5+, %
CH 285.0 73 54 38 12
CF/CCFn 286.2 20 31 33 42
CFCFn 288.7 0.2 8 15 26
CF2 291.1 3 7 10 16
CF3 293.3 4 0 4 4
Atomic percent of C bound α or β to F, from C(1s) 27 46 62 88
F atomic percent from corrected F(1s)/C(1s) ratio 30 40 54 59

All ion fluences equivalent to 1.5 × 1016 F atoms/cm2. Shown are averages of ion modified data in Fig. 1 and one replicate set of each data.