spectrophotometry (including microspectrophotometry and bifurcated fibre probe use) |
used for measuring optical scattering from or through samples; polarized or unpolarized illumination can be provided with broadband or laser sources and appropriate filters; sample orientation and light incidence angle can usually be controlled; light can be delivered using optical fibres or conventional lenses; detection of scattered light achieved using fibre-fed spectrometers (for white light illumination) or large-area photodiodes (for laser or monochromatic light illumination) |
difficult to measure absolute values of reflectance or transmittance; great care should be taken when using white reference standards; use of microspectrophotometer or bifurcated fibre probe precludes independent variation of angles of light incidence and scatter detection |
incident and scattered light wavelengths; angle of incidence; scattered light detection angle; sample orientation; incident and scattered light polarization state; incident and scattered light intensities |
integrating sphere photometry |
used for measuring optical scattering from or through samples; light delivered using optical fibres or conventional lenses (dependent on sphere design); detection of scattered light achieved using fibre-fed spectrometers (for white light illumination) or large-area photodiodes (for laser or monochromatic light illumination; dependent on sphere design) |
sample orientation and the illumination and scattered light detection angles are not selectable; there is no polarization selectivity; great care should be taken when using white reference standards |
incident and scattered light wavelengths; incident and scattered light intensities |
scatterometry and reflectometry |
used for measuring scattered light distribution by applying point source illumination, the direction of which can be varied; detection can be realized with scanning fibres connected to a photodiode array spectrophotometer or by imaging |
measurements with scanning fibres are extremely laborious; imaging methods require special optical methods when large spatial angles are to be spanned |
the measured bidirectional reflectance distribution function involves knowledge of spatial directions of incident and scattered light, wavelength, polarization |
scaled model fabrication and electromagnetic interrogation |
used for replicating accurate millimetre- and centimetre-scale models appropriate for interrogation using much longer wavelengths (e.g. microwaves); replication processes are variable, but can include rapid prototyping and laser sintering; large-scale models are much easier to position and manipulate accurately; for biomimetic application studies, the models may be fabricated using one or more of a wide range of dielectric, semiconductor or metallic materials |
the material used to replicate large-scale models should have analogous optical properties to the original optical sample |
incident and scattered light wavelengths; angle of incidence; scattered light detection angle; sample orientation; incident and scattered light polarization state; incident and scattered light intensities |
SEM |
used for imaging the surfaces or exposed interiors of samples; typical available resolutions are a few nanometres to tens of nanometres; samples may be pre-prepared with an FIB procedure, freeze–fracture or mechanically induced damage to reveal subsurface structures; estimated dimensions of samples' surface nanostructure |
owing to two-dimensional perception issues, SEM offers much less accuracy than TEM in quantifying dimensions of subsurface structures; poor sample preparation may lead to low image quality owing to electrical charging issues |
orientation of the sample on the SEM stub; metal overlayer thickness; sample stub orientation in SEM; working distance; beam current and voltage; SEM detector mode (e.g. backscattered, secondary electrons) |
TEM |
used for imaging ultramicrotomed samples' thin (approx. 70 nm thick) sections; typical available resolutions are a few nanometres to tens of nanometres; different staining processes create differential greyscale contrast in the sample's nanostructure; accurate quantification of nanostructured dimensions and structural geometries is possible |
ultramicrotome facilities and expertise with biophotonic sample sectioning have limited availability; poor sample fixing and staining protocols, in addition to poor sectioning technique may lead to artificial results |
sample preparation fixative, impregnation and staining chemicals; ultramicrotome section thicknesses and orientations; TEM E-beam spot diameter and voltage |
AFM |
used for forming digital maps of samples' surface features; enables estimates of large area surface height distributions, which is not accurately possible with either SEM or TEM |
does not work accurately for samples that exhibit features with significant height-to-separation ratios, or with crevice-like or partially covered subsurface features |
operating mode (e.g. contact mode, tapping mode, etc.); probe-tip profile |