Table 1.
Statistics for data collection and refinement
| Statistic | XDH | XO | XDH
|
|
|---|---|---|---|---|
| Fe-edge | Fe-peak | |||
| d-Spacing, Å | 25–2.1 | 25–2.5 | 25–4.0 | 25–4.0 |
| Wavelength | 0.9790 | 1.0000 | 1.7419 | 1.7338 |
| No. of unique reflections* (free) | 154,198 (7,710) | 51,300 (4,651) | 25,562 | 26,217 |
| Completeness, % | 87.3 | 97.9 | 97.4 | 99.7 |
| I/σ(I) | 12.0 | 16.5 | 13.8 | 21.3 |
| Rcryst* (Rfree)† | 19.8 (23.8) | 21.2 (27.5) | ||
| Deviations in bond lengths, Å | 0.010 | 0.013 | ||
| Deviations in bond angles, ° | 1.3 | 1.4 | ||
| Average B-value, Å2 | 18.8 | 37.1 | ||
| No. of nonhydrogen atoms | 22,372 | 10,109 | ||
| Waters | 2,049 | 597 | ||
Rcryst = Σhkl |Fobs − Fcalc|/Fobs, where Fobs and Fcalc are the observed and the calculated structure factors, respectively, and the summation is over the reflections used for model refinement.
Rfree as for Rcryst except summed only over the reflections not used for model refinement (5.0% for XDH and 9.1% for XO).