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. 2009 May 6;96(9):3708–3715. doi: 10.1016/j.bpj.2009.01.048

Figure 3.

Figure 3

The relative errors between the HM fit and the input of the persistence length (a), step-size (b), and lifetime (c), using a WLC distribution, with respect to the ratio between step-size and thermal fluctuations. The error bars represent the spread in the relative error for 10 different traces.