Figure 5.
SEM image of a silica seed layer (2.3nm) treated specimen, failure mode is shown to be cohesive failure (completely within the composite). (b) Displays the post-fracture interface which still appears to be undisturbed.
SEM image of a silica seed layer (2.3nm) treated specimen, failure mode is shown to be cohesive failure (completely within the composite). (b) Displays the post-fracture interface which still appears to be undisturbed.