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. Author manuscript; available in PMC: 2009 Aug 7.
Published in final edited form as: Langmuir. 2008 Apr 5;24(9):4901–4906. doi: 10.1021/la800037r

Table 1.

Averages and Standard Deviations for XPS-Determined Atomic Concentrations (atom %) for UV- and Redox-Polymerized Bis-SorbPC Bilayersa

C 1s O 1s N 1s P 2p Si 2p
UV
av 55.3 24.4 1.1 2.3 16.8
std dev 2.0 1.3 0.4 0.4 0.6
Redox
av 63.2 21.6 1.1 1.9 12.3
std dev 1.5 0.8 0.2 0.4 0.7
a

Comparison of the Si signal indicates that the UV-polymerized layer is thinner than the redox-polymerized sample.