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. Author manuscript; available in PMC: 2009 Aug 7.
Published in final edited form as: Langmuir. 2008 Apr 5;24(9):4901–4906. doi: 10.1021/la800037r

Table 2.

Adjusted XPS Atomic Concentrations (atom %) for UV- and Redox-Polymerized Bis-SorbPC Bilayers with the Si Wafer Contributions Removed Using Eq 1 and the PSLB Concentrations Renormalized to 100 atom %a

C 1s O 1s N 1s P 2p
UV
av 75.2 21.5 1.1 2.2
std dev 2.5 1.7 0.5 0.5
Redox
av 79.9 16.4 1.3 2.4
std dev 1.9 1.0 0.2 0.5
Theory
74 22.2 1.9 1.9
a

The theoretical values were determined from the stoichiometry of the bis-SorbPC molecule.