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. 2009 Jul 17;95(2):021111. doi: 10.1063/1.3184573

Figure 1.

Figure 1

(a) Schematic of PC designed in this work. The dimensions are as follows: period Λ=360 nm, grating depth d=60 nm, SiO2 thickness tSiO2=300 nm, and TiO2 thickness tTiO2=160 nm. The grating width is 50% of the period. (b) Atomic force micrograph of PC fabricated by nanoreplica molding, showing the measured period of Λ=368 nm and a grating depth of d=60 nm, in good agreement with the simulated structure.