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. 2009 Aug 19;97(4):1225–1231. doi: 10.1016/j.bpj.2009.06.013

Figure 1.

Figure 1

Picture (top) and schematic diagram (bottom) of an AFM scan head placed above ATR internal reflection element (IRE). The sample is placed directly in contact with the top surface of the IRE. The infrared beam is internally reflected through the length of the IRE. At each reflection, a standing electromagnetic wave of infrared light extends into the sample, and the amplitude of the wave decays exponentially with distance from the surface of the IRE.