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. Author manuscript; available in PMC: 2009 Oct 1.
Published in final edited form as: Nat Nanotechnol. 2009 Feb 22;4(4):255–258. doi: 10.1038/nnano.2009.11

Figure 2. Reflectivity spectrum (a) and corresponding Fourier transform (b) of a porous Si double layer film.

Figure 2

The peaks in the Fourier transform spectrum are assigned to the porous layers indicated in the inset. The three reflected interfering beams are indicated with the letters a, b, and c. Reflectivity trace is measured in air and is not corrected for instrumental spectral response.