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. 2009 Aug 25;106(36):15119–15124. doi: 10.1073/pnas.0902778106

Fig. 4.

Fig. 4.

Characterizing interfacial width. (A and B) Density profiles of water and SAM in −CF3 and −CONH2 systems, respectively. Intercalation of water in the rough −CONH2 surface is seen in B. The dotted lines indicate locations of half density planes for SAM and water. The distance between these planes characterizes the interfacial width, and is shown in C as a function of experimental cos(θ). D shows total (SAM+water) density profiles for four surfaces.