Fig. 2.
Patch-clamp measurements on HEK cells in the whole-cell configuration. a A typical voltage protocol applied to a HEK cell and the resulting current recording. Voltage ramps (ramp) are started from different holding potentials. Note that capacitive peak currents resulting after a voltage step (step) are shown only partly. b Current recordings after subjecting a HEK cell to a +2 V/s ramp starting from a holding potential at −75 mV in the presence and absence of 20 μm WO−, respectively. Dotted lines were used to determine the amplitude of corresponding capacitive currents, Ic