Skip to main content
. Author manuscript; available in PMC: 2010 May 1.
Published in final edited form as: J Electron Spectros Relat Phenomena. 2009 May 1;172(1-3):2–8. doi: 10.1016/j.elspec.2009.02.008

Table 3.

Angle-resolved XPS determined elemental compositions of NH2-SAMs on Au.

Atomic % (StdDev)*
TOA Au C O N S
0 41.1 (2.5) 49.9 (2.5) 3.1 (0.3) 4.2 (0.5) 1.7 (0.1)
55 28.5 (2.4) 61.7 (2.7) 3.4 (0.6) 4.7 (0.4) 1.8 (0.1)
75 17.3 (1.3) 70.2 (1.4) 4.7 (0.6) 5.9 (0.6) 1.8 (0.1)
Atomic % Ratios (StdDev)*
TOA C/Au N/Au S/Au O/Au O/N
0 1.21 (0.10) 0.10 (0.01) 0.04 (0.00) 0.08 (0.01) 0.75 (0.11)
55 2.16 (0.21) 0.16 (0.02) 0.06 (0.01) 0.12 (0.02) 0.71 (0.13)
75 4.05 (0.31) 0.34 (0.04) 0.10 (0.01) 0.27 (0.04) 0.79 (0.12)
*

Average experimental composition from three distinct samples (one spot per sample). All data were taken at 0°, 55°, and 75° takeoff angles in the electrostatic mode. Note: the takeoff angle is defined as the angle between the surface normal and the analyzer.