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. Author manuscript; available in PMC: 2009 Nov 17.
Published in final edited form as: Opt Express. 2009 Aug 3;17(16):13768–13784. doi: 10.1364/oe.17.013768

Fig. 11.

Fig. 11

Low-order (LO) measured in the reconstructed VMM signal is plotted as a function of higher-order (HO) error measured in the input signal.