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. Author manuscript; available in PMC: 2009 Nov 17.
Published in final edited form as: Opt Express. 2009 Aug 3;17(16):13768–13784. doi: 10.1364/oe.17.013768

Fig. 5.

Fig. 5

Plot of intensity at every pixel for the WFS for backscattered light in the system. These images are captured when no subject is in the system, and in an ideal system would be only CCD noise. Contamination of the gold surface caused by outgassing of the glue used to attach the MEMS window introduced significant backscatter on the original MEMS device, but a newer test device provided by BMC without the contamination has reduced backscatter. The backscatter of the test device is nearly identical to backscatter from a flat mirror (not shown).