Table 1.

Analysis of the x-ray data set from a form V crystal used for structural solution

Measurement	Value at resolution
	All	71–15 Å	−10 Å	−7.5 Å	−5 Å	−3.5 Å	−3 Å	−2.75 Å	−2.5 Å	−2.25 Å	−2.0 Å
Independent reflections	58,765	213	487	928	3,747	10,017	8,820	6,863	9,598	11,238	6,854
% of theoretical	70.0	84.2	91.5	93.5	95.1	95.8	95.4	92.6	90.2	70.9	27.8
Average intensity	26.3	88.1	100.9	79.0	44.5	61.6	29.1	16.2	11.4	8.5	7.0
σ	3.1	3.8	3.3	2.7	2.3	3.8	3.3	3.1	3.0	2.9	3.3