Table 4.

MAD phasing statistics

Wavelength, Å	0.9871 Å	0.9795 Å	0.9793 Å	0.9649 Å	Scattering factor
					f′	f"
0.9871	0.044	0.060	0.050	0.068	−4.34	0.51
	(0.034)
0.9795		0.063	0.048	0.083	−9.08	2.75
		(0.037)
0.9793			0.079	0.072	−7.08	4.01
			(0.039)
0.9649				0.084	−3.08	3.75
				(0.051)
FOM = 0.91; R(°Fa) = 0.47; R(°Ft) = 0.092; 〈Δ(Δφ)〉 = 41.7; 〈σ(Δφ)〉 = 17.5

Table values represent 〈Δ|F|²〉^1/2, where Δ|F| is the absolute value of the Bijvoet difference at one wavelength (diagonal elements) or the dispersive differences between two wavelengths (off-diagonal element). The values for centric Bijvoet reflections, which would be equal to zero for perfect data and serve as an estimate of the noise in the anomalous signals, are shown in parentheses. The listed scattering factors f′ and f" are the refined values for selenium atoms in the crystal of MJ eIF-5A. R = Σ_hkl[Σ_i∥F_i| − 〈F〉∥/Σ_hkl|F|. °F_t is the contribution to the structure factor by normal scattering from all atoms. °F_a is the contribution to the structure factor from the anomalously scattering atoms. Superscript ° indicates the wavelength-independent value. Δ(Δφ) is the difference between two independent determinations of Δφ, which is the phase difference between °F_t and °F_a.