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. Author manuscript; available in PMC: 2010 Dec 1.
Published in final edited form as: Nano Lett. 2009 Dec;9(12):4049–4052. doi: 10.1021/nl9022176

Figure 4.

Figure 4

SEM images of 500 nm scale cubic particles patterned with dissimilar materials. The particles have 20 nm thick curvilinear patterns of Au defined precisely with the letters J and U with 50 nm line widths on the outer faces of Ni. The SEM images were captured using a back scatter detector which is sensitive to the atomic mass; hence the Au appears brighter than Ni. (a) SEM image of a patterned cubic particle of Au on Ni. (b) In addition to the pattern of Au on Ni, the particle also has 100 nm square holes within each face. (c) SEM image showing the parallel nature of the assembly with yields of approximately 30 %. Scale bars: 100 nm.