Fig. 5.

Reconstruction of the complex object and probe function for a Siemens star test pattern. Phase is encoded as color and amplitude as brightness (see colorwheel in A). (Scale bars: 500 nm.) (A) Inset from a reconstruction of 20 × 10 diffraction patterns collected around the central region of the Siemens star [33 × 47 nm (h × v) pixel size]. A line profile of the phase distribution, drawn along the dashed line shown in C, is depicted in the lower part of the image. A Gaussian fit to a central gradient region of the phase profile is marked by the red line. (B) Reconstructed probe function, backpropagated over the propagation distance between pinhole and sample, as determined with the optical on-axis microscope. (C) Scanning electron micrograph of the pinhole used as the beam-defining aperture in all experiments.