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. 2008 Nov 15;99(4):361–370. doi: 10.1007/s00422-008-0259-4

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© The Author(s) 2008

This article is distributed under the terms of the Creative Commons Attribution Noncommercial License which permits any noncommercial use, distribution,and reproduction in any medium, provided the original author(s) and source are credited.

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Fig. 4 — Application of the dynamic I–V method with conductance injection. a The function is plotted (symbols) together with the fit (red) to the function (14). Inset: Two exponential components are clearly seen in a semi-log plot of F(V) with the leak currents subtracted. b Post-spike dynamics of the EIF model parameters (symbols) together with the fits to an exponential model. The time-dependent resting potential shows a clear biphasic response as was seen for layer-5 pyramidals in the current-injection protocol. c Comparison of the prediction of the rEIF model (green)with experimental data again shows good agreement in the subthreshold region and in the prediction of spike times

Inline graphic — Application of the dynamic I–V method with conductance injection. a The function is plotted (symbols) together with the fit (red) to the function (14). Inset: Two exponential components are clearly seen in a semi-log plot of F(V) with the leak currents subtracted. b Post-spike dynamics of the EIF model parameters (symbols) together with the fits to an exponential model. The time-dependent resting potential shows a clear biphasic response as was seen for layer-5 pyramidals in the current-injection protocol. c Comparison of the prediction of the rEIF model (green)with experimental data again shows good agreement in the subthreshold region and in the prediction of spike times