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. 2009 Nov 27;65(Pt 12):1254–1257. doi: 10.1107/S1744309109043267

Table 1. Data-collection and refinement statistics.

Data collection  
 X-ray source Rotating anode
 Wavelength (Å) 1.5418
 Space group R3(H)
 Unit-cell parameters  
   a (Å) 85.2
   b (Å) 85.2
   c (Å) 45.5
 Resolution (Å) 28–2.01 (2.12–2.01)
 No. of unique observations 7993 (1019)
 Redundancy 11.2 (10.6)
 Completeness (%) 97.9 (85.8)
I/σ(I) 27.2 (8.2)
Rmerge (%) 7.1 (31.2)
Refinement  
Rconv (%) 16.4
Rfree§ (%) 20.8
 R.m.s.d., bond lengths (Å) 0.003
 R.m.s.d., bond angles (°) 0.7
 Mean B factor (Å2) 19.4

R merge = Inline graphic Inline graphic, where Ii(hkl) is the intensity of an individual measurement of the reflection with Miller indices hkl and 〈I(hkl)〉 is the mean intensity of that reflection.

R conv = Inline graphic Inline graphic, where |F obs| and |F calc| are the observed and calculated structure-factor amplitudes.

§

R free is equivalent to R conv but calculated with reflections omitted from the refinement process (10% of reflections were omitted).