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. Author manuscript; available in PMC: 2010 Jan 20.
Published in final edited form as: Scanning. 2009 Mar–Apr;31(2):49–58. doi: 10.1002/sca.20133

Fig. 5.

Fig. 5

AFM height images of standard Ni-plate was scanned in different scanning time with the particle analysis in whole area. (a)t=5min, (b)t=60min, (c)t=180min, (d)t=300 min. All images were collected in the same parameters and just did “X/Y flatten” one time before particle analysis.