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. Author manuscript; available in PMC: 2010 Apr 1.
Published in final edited form as: Clin Psychol Rev. 2009 Feb 7;29(3):243. doi: 10.1016/j.cpr.2009.01.005

Table 2.

Depression symptom measures

Measure Source Respondent Nitems NDepStudies Psychometrics
rxx’
BDI Beck, Ward, Mendelson, Mock, and Erbaugh (1961) Patient 21 > 1500 .86 .66
CES-D Radloff (1977) Patient 20 > 1200 .85 .57
HAM-D Hamilton (1960) Clinician 17 > 1200 .89
Zung Zung (1965) Patient 20 > 800 .83
MADRS Montgomery and Asberg (1979) Clinician 10 > 800 .90
HADS-D Zigmond and Snaith (1983) Patient 14 ≈ 800 .85 .86
SCL-90 Derogatis, Lipman, and Covi (1973) Patient 90 > 600 .86 .81
CIDI Kessler, Andrews, Mroczek, Ustun, and Wittchen (1998) Patient Varies ≈ 350 .95
SCIDIII Spitzer, Williams, Gibbon, and First (1992) Clinician Varies ≈ 350 .64–.93
SCIDIV American Psychiatric Association (1994) Clinician varies ≈ 350 .61–.80
MDI Bech (1998) Clinician 12 ≈ 30 .90
IDS-SR Rush, Gullion, Basco, Jarrett, and Trivedi (1996) Patient 30 ≈ 30 .92
IDS-CR Rush et al. (1986) Clinician 30 ≈ 25 .90
SCL-20 Derogatis et al. (1974a,b) Patient 90 ≈ 20 .92
QIDS-SR Rush et al. (2003) Patient 18 ≈ 20 .86
QIDS-C Rush et al. (2003) Clinician 18 ≈ 10 .85

Measure abbreviations: BDI: Beck Depression Inventory, CES-D: Center for Epidemiological Studies Depression Scale, HAM-D: Hamilton Depression Rating Scale, Zung: Zung Self-Rating Depression Scale, MADRS: Montgomery–Asberg Depression Rating Scale, HADS-D: Hospital Anxiety and Depression Scale-Depression, SCL-90: Symptom Check List-90 items, CIDI: Composite International Diagnostic Interview, SCIDIII: Structured Clinical Interview (DSM-III), SCIDIV: Structured Clinical Interview (DSM-IV), MDI: Major Depression Inventory, IDS-SR: Inventory of Depressive Symptoms-Self-Rated, IDS-CR: Inventory of Depressive Symptoms-Clinician Rated, SCL-20: Symptom Check List-20 items, QIDS-SR: Quick Inventory of Depressive Symptomatology-Self-Rated, QIDS-C: Inventory of Depressive Symptoms-Clinician.

The psychometrics include measures of internal consistency () and test-retest reliability (rxx’).