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. 2009 Sep 17;11(1):113–131. doi: 10.1007/s10162-009-0185-8

FIG. 8.

FIG. 8

Representation of the detection thresholds of Figure 5 in terms of the size of ITD fluctuations, RMS(ITD), in a 100-Hz-wide band centered at 500 Hz. For each detection threshold the relation is shown between the RMS(ITD) of the noise-alone condition (abscissa) to the same metric extracted from the noise + signal condition at the detection threshold (ordinate). Symbols as in Figures 5 and 7. Lines are second order polynomial fits Inline graphic to the data. Fit parameters are indicated in each plot. The (N0Sπ)mx and Inline graphic thresholds obtained with 3-dB modulation depth were excluded (N0Sπ)ϕ from the fits, because their MLD vanished.