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. Author manuscript; available in PMC: 2010 Mar 1.
Published in final edited form as: Proc IEEE Inst Electr Electron Eng. 2009;97(3):513–552. doi: 10.1109/JPROC.2009.2013612

Table 3.

Example Design Matrix Showing Relationship of Parameters in Piezoresistive Cantilever Beam for Displacement Sensing [Trends Within the Ranges of Figs. 12, 15, 16 and 18 and (13) and (14)]. As the Controlled Design Parameter Increases (While Other Parameters Are Held at Typical Values and Input Displacement is Fixed), the Observed Parameters Respond as: Increasing (↑), Decreasing (↓), Weak or No Relation (-).

Observed Parameters
Power (W) Volume (m3) Bandwidth & ωn (Hz) Sheet resistance (Ω/square) Sensitivity (V/m) 1/f Noise (V/√Hz) Johnson Noise (V/√Hz) Junction depth (m) TCR (/°C) TCS (/°C)
Controlled Parameters n (cm−3) - - - *
Vb (V) - - - - - - -
Dt (m) - - -
tp (m) - - -
wp (m) - - - - - -
lp (m) - - - - -
h (m) - - - - - - -
L (m) - - - - - - -
b (m) - - - - - - - - -
*

Note: Please See Fig. 15.

Vb, Vb, and Dt are the Dopant Concentration, Bias Voltage, and Diffusion Length, Respectively. tp, wp, and lp are the Piezoresistor Thickness, Width, and Length, Respectively. h, b, and L are the Cantilever Beam Thickness, Width, and Length, Respectively