Skip to main content
. 2009 Sep 8;3(3):034104. doi: 10.1063/1.3224669

Figure 2.

Figure 2

Thickness of silver film depends on number of layers deposited. We control the electrode height by varying the number of layers deposited. The height of a polished, deposited silver film is measured by profilometry. Error bars represent standard deviation of at least three independent measurements.