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. Author manuscript; available in PMC: 2010 Mar 12.
Published in final edited form as: Dalton Trans. 2009 Oct 16;(46):10250–10255. doi: 10.1039/b913320h

Figure 2.

Figure 2

XRD patterns of the products Na4Si4 from optimized reactions of NaH with Si. The inset is an enlarged view of the XRD pattern in the range of 25– 38 °. The red lines indicate the calculated X-ray diffraction peak positions for Na4Si4.