Table 1.

Control of the surface properties of the implants. (Roughness parameters measured by AFM at 50 μm×50 μm, measurement number (n)=4: Sa, arithmetic average of height deviation; Sq, root mean square of height deviation; Ssk, asymmetry of height distribution; Sdr, increment of the interfacial surface area relative to the area of the projected x, y plane.)

surface property	OPIII (control) implant	MgPIII (test) implant
chemical composition	mainly TiO2 contaminant, C	mainly TiO2 and Mg≤5%; contaminant, C
surface texture	rotation-oriented margin and groove; wavelength≈35 μm	rotation-oriented margin and groove; wavelength≈35 μm
roughness	Sa 0.27 (±0.04) μm	Sa 0.24 (±0.02) μm
	Sq 0.33 (±0.05) μm	Sq 0.29 (±0.03) μm
	Ssk 0.36 (±0.24)	Ssk 0.19 (±0.23)
	Sdr 6.1 (±2.6)%	Sdr 5.5 (±1.6)%