Figure 3.

A) High magnification, 29,000X of a Cryomesh hole with vitreous ice at 45° tilt. Along the edges of the hole ridges can be seen that are left behind from the manufacturing process. By measuring the length of these ridges in projection we can estimate the thickness of the support substrate. B) An image taken over the ceramic support substrate, with examples of the features that are artifacts of the ceramic material. These would shift and disappear/reappear if the stage where tilted or the beam-tilt changed. C) The power spectrum of the image in panel B.