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. Author manuscript; available in PMC: 2011 Jan 5.
Published in final edited form as: J Phys Chem C Nanomater Interfaces. 2010 Jan 5;114(12):5565–5573. doi: 10.1021/jp9066179

Figure 5.

Figure 5

The depth resolution measured using the 84%-16% method for the C2H5O+ and C3H7O+ signals during dual-beam depth profiling (Bi1+/C60+) for different R parameters. The best resolutions obtained for C2H5O+ (8.4 nm) and for C3H7O+ (10.4 nm) and during C60+ single beam at 10 keV are indicated as references (dotted lines).