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. Author manuscript; available in PMC: 2011 Jan 5.
Published in final edited form as: J Phys Chem C Nanomater Interfaces. 2010 Jan 5;114(12):5565–5573. doi: 10.1021/jp9066179

Figure 7.

Figure 7

The depth resolution measured by the 84%-16% method for the C2H5O+ and C3H7O+ signals produced during dual-beam depth profiling of tetraglyme with Bi3+ and C60+. The best resolutions obtained for C2H5O+ (8.4 nm) and for C3H7O+ (10.4 nm) and during C60+ single beam at 10 keV are indicated as references (dotted lines).