Skip to main content
. Author manuscript; available in PMC: 2011 Apr 29.
Published in final edited form as: J Phys Chem B. 2010 Apr 29;114(16):5283–5291. doi: 10.1021/jp100486h

Figure 1.

Figure 1

Film thickness from ellipsometry measurements as a function of number of layers [rPDMAEMA/DNA]n/2. The data were fitted by two linear functions for 1–10 layers (□) (slope = 2 nm per layer) and 11–30 layers (○) (slope 5 nm per layer (number of trials = 3).