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. Author manuscript; available in PMC: 2010 May 3.
Published in final edited form as: Opt Express. 2009 Jul 20;17(15):12285–12292. doi: 10.1364/oe.17.012285

Fig. 4.

Fig. 4

Speckle illumination increases lateral and axial resolving power. (a–d) Phase maps of polystyrene beads (200nm diameter) measured with a conventional HPM. (e–h) Phase maps measured with a speckle illumination of the same samples in (a–d). Scale bar indicates 500 nm. (i) Lateral point spread functions of a conventional HPM (blue line) and a speckle illumination (red line). (j) Axial point spread functions of a conventional HPM (blue line) and a speckle illumination (red line). For SDHM, 50 raw E-field images are processed to reduce singularity points.