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. Author manuscript; available in PMC: 2010 Jul 1.
Published in final edited form as: IEEE Sens J. 2009 Jul 1;9(7):752–760. doi: 10.1109/JSEN.2009.2021805

Fig. 3.

Fig. 3

(a) Micrograph of the 1.5 mm × 1.5 mm die showing arrays of the test pixels and other test structures. Panels (b), (c), and (d) show measured pixel outputs from the 3T APS, 10 fF CTIA APS, and the 5 fF CTIA APS, respectively. All APS pixels are implemented with n-well/p-sub photodiodes. The CTIA APS was covered by an OD 1.8 neutral density filter attenuating incident light by a factor of 62.5.