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. 2010 Apr 30;66(Pt 5):601–604. doi: 10.1107/S1744309110011942

Table 2. Summary of X-ray data-measurement and processing statistics.

Values in parentheses are for the highest resolution shell.

  SeDsbA SeDsbL SeSrgA
Wavelength (Å) 0.956667 0.956667 1.5418
Temperature (K) 100 100 100
Space group P21 P21212 C2
Unit-cell parameters (Å, °) a = 37.3, b = 61.7, c = 42.8, α = γ = 90, β = 101.3 a = 85.6, b = 46.6, c = 60.2, α = β = γ = 90 a = 186.3, b = 80.3, c = 105.5, α = γ = 90, β = 124.3
Anticipated solvent content (%) 49.2 53.9 62.3
Resolution range 50.0–1.55 (1.58–1.55) 50.0–1.57 (1.60–1.57) 36.4–2.6 (2.7–2.6)
No. of observations 192033 246716 134920
No. of unique reflections 26275 (1039) 34491 (1693) 37521 (3734)
Redundancy 7.3 (6.6) 7.2 (7.0) 3.6 (3.4)
Completeness (%) 94.2 (75.7) 99.9 (100) 99.8 (99.4)
Rmerge 0.082 (0.217) 0.066 (0.459) 0.12 (0.425)
I/σ(I) 19.5 (8.5) 29.6 (4.1) 6.1 (2.0)

R merge = Inline graphic Inline graphic, where I i(hkl) is the measured intensity of each individual reflection and 〈I(hkl)〉 is the mean value of the intensity.