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. 2010 Apr 5;107(16):7219–7224. doi: 10.1073/pnas.0913172107

Fig. 4.

Fig. 4.

Evolution of nonlinearity with film thickness. (A) Spatial maps of nonlinearity for different film thicknesses (thicknesses shown across top). (B) Histograms of nonlinearities for different film thicknesses (the areas are not normalized). (C) Comparison of macroscopic dielectric measurements and averaged PFM piezoelectric data (no free parameters).