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. Author manuscript; available in PMC: 2011 Jun 1.
Published in final edited form as: Microsc Microanal. 2010 Apr 7;16(3):327–336. doi: 10.1017/S1431927610000231

Figure 2.

Figure 2

(a) Image of Siemens calibration standard with 30 nm minimum features taken at 5.4 keV using zone plate with 30 nm outermost width and (b) blowup of the central star region.