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. 2010 Jun 10;6(6):e1000811. doi: 10.1371/journal.pcbi.1000811

Figure 3. Critical mutation rates in the neutral-staircase fitness landscape.

Figure 3

Critical mutations rates derived from Equation (5) are plotted as a function of the total number of blocks Inline graphic for varying numbers of active blocks Inline graphic. The critical mutation rates increase slowly as the number of active blocks increases. Parameters: number of bitpairs per block Inline graphic, reproductive capacity Inline graphic, between-block bitstring length Inline graphic.