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. 2010 Apr 19;107(19):8513–8518. doi: 10.1073/pnas.1003052107

Fig. 3.

Fig. 3.

Defect-level diagrams for vacancy-related complexes. These diagrams show the single-particle defect states for (A) the Inline graphic and (B) the NV-1 in diamond, as well as for (C) the Inline graphic and (D) the Inline graphic in 4H-SiC. The spin-majority (spin-minority) channel is denoted by upward- (downward-) pointing arrows.