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. 2010 May 29;17(Pt 4):479–485. doi: 10.1107/S0909049510019710

Figure 4.

Figure 4

Intensity of repeated measurements of selected reflections (small circles, axis on left) and normalized X-ray beam intensity from the photodiode (small triangles in magenta color, axis on right) for measurements 1 (a) and 2 (b).