Fig. A1.

Noise characteristics of the CC D image sensor used in Fig. 3 are quantified. (a) reports the variance values of the pixels of the sensor chip measured with different integration times as a function of the illumination intensity. (b) quantifies the decomposition of various noise terms as a function of the illumination intensity. The fitted strengths of individual noise terms in (b) were calculated based on the parameter values estimated in (a). The results indicate that dominant detection noise sources were RIN and SN in our experiments reported in Fig. 3.