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. Author manuscript; available in PMC: 2011 Jun 1.
Published in final edited form as: Acta Mater. 2010 Jun 1;58(10):3773–3780. doi: 10.1016/j.actamat.2010.03.018

Fig. 4.

Fig. 4

SEM images of PIN-PMN-PT crystals after fatigue test. <001> oriented sample (a); <110> oriented samples showing (110) cleavage planes (b); non-180° domain band structure (c); micro/macro cracks (d).