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. Author manuscript; available in PMC: 2011 Jul 1.
Published in final edited form as: Anal Chem. 2010 Jul 1;82(13):5697–5706. doi: 10.1021/ac1007128

Figure 6.

Figure 6

A) Effect on resonances of dispersion characteristics of Si3N4 and soda lime, for structure of Λ = 2.3 μm, dgr = 0.3 μm, and dwg = 0.3 μm, when a TE-polarized wave is normally incident. B) E-Field amplitude distribution at resonance wavenumber (ν̄ = 2869 cm−1) without considering the dispersion properties of both Si3N4 and soda lime. C) E-field amplitude distribution at resonance wavenumber (ν̄ = 2858 cm−1) considering the dispersion properties of Si3N434 and soda lime.35 The surface relief of the film to be fabricated is depicted using white lines. D) Comparison of E-field amplitude distributions shown in (B) and (C) at the interface of grating and waveguide layers.