(a) Time evolution of LLT in the presence of a TPP crystal, which was observed with
polarizing microscopy under the crossed Nicols condition. At the beginning (0 min), we
observe only the TPP
crystalline spherulite with the Maltese cross pattern. Thereafter, the layer of liquid
II, which has no birefringence, is formed on the surface of the TPP spherulite (40 min) and its
thickness linearly grows with time (60, 80 min) (see f). (b) Time
evolution of LLT in the presence of a PET surface. In this case, LLT proceeds while
forming a thin film of liquid II, which also grows linearly with time (see f):
compete wetting. White dashed lines indicate the location of the surface. (c,
d) Time evolution of LLT in the presence of PTFE (c) and gold (d) surface. Nuclei of
liquid II are preferentially formed on the substrates with a finite contact angle
(θ≤90°): partial wetting. (e) Time evolution of LLT in the presence of
an aluminium surface.
Nuclei of liquid II do not have any contact to the aluminium surface and normal NG-type
droplet growth in bulk was observed: non-wetting. The scale bars correspond to 10 μm.
(f) Growth kinetics of a complete wetting layer of liquid II. Time evolution of
the thickness of the wetting layer (left axis) formed on a TPP crystal (a), PET
(b) and PVDF (Fig. 2b) surface, together with the radius of
a droplet of liquid II (right axis). Time t is shifted by birth time
t0. Temperature was 220 K. All data can be well fitted by linear
functions, indicating the same growth rate irrespective of the substrate materials. The
growth rate of the wetting layer is estimated as 2.95±0.15 nm s−1.